- XRD investigations of polycrystalline materials – qualitative and quantitative phase analysis; phase analysis of micro-quantities using polycapillary optics; measurements at a high temperature (from +20°C to +1100°C in air or inert gas atmosphere); determination of crystallite size, micro and macro stresses, preferred crystallographic orientation using pole figures; investigations of thin films (1–10 nm) by in-plane technique; rocking curve and reciprocal lattice mapping measurement of epitaxial layers; determination of thickness, density and roughness of thin layer and multi-layers by X-ray reflectometry (XRR); determination of size distribution of nanoparticles and nanopores by small angle scattering of X-ray (SAXS) in transmission and reflection modes.
- Investigations of surface morphology and cross section using scanning electron microscopy (SEM) and focused ion beam (FIB).
- Qualitative and quantitative chemical analysis of powders, minerals, catalysts, ceramics, glass, plastics, metals and alloys using fluorescent X-ray spectroscopy (WD-XRF), electron microprobe analysis (EDX) and X-ray photoelectrons spectroscopy.
- Investigations of internal structure by transmission electron microscopy (TEM, STEM-HAADF, EDX, selected area electron diffraction).
- Investigation of chemical and phase composition of thin layers and their depth profiling using X-ray photoelectron spectroscopy (XPS-UPS) and Auger electron spectroscopy methods.
- Determination of carbon and sulfur content using the CS-2000 carbon and sulfur analyzer. Carbon detection limit in steels – 1 ppm.
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